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Trace-Based Post-Silicon Validation for VLSI Circuits

Hoofdkenmerken

Auteur:	Liu, Xiao; Xu, Qiang
Titel:	Trace-Based Post-Silicon Validation for VLSI Circuits
Uitgever:	Springer International
ISBN:	9783319375946
Serie:	Lecture Notes in Electrical
Editie:	Softcover reprint of the original 1st ed. 2014
Land van oorsprong:	Switzerland
Prijs:	€ 133,09
Verschijningsdatum:	23-08-2016
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Computer architecture & logic design
Geillustreerd:	18 Tables, black and white; 38 Illustrations, color; 21 Illustrations, black and white; XV, 108 p. 59 illus., 38 illus. in color.

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	108
Hoogte mm.:	235
Breedte mm.:	155
Gewicht gr.:	273

Inhoud:

This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.