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Hoofdkenmerken

Auteur:	Hay, David C.
Titel:	Data Model Patterns: A Metadata Map
Uitgever:	Elsevier Science & Technology
ISBN:	9780120887989
Serie:	The Morgan Kaufmann Series in Data Management Systems
Land van oorsprong:	United States
Prijs:	€ 85.73
Verschijningsdatum:	27-07-2006
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Databases
Geillustreerd:	Approx. 180 illustrations; Illustrations, unspecified
Dewey code:	005.74

Technische kenmerken

Verschijningsvorm:	Hardback
Paginas:	432
Hoogte mm.:	243
Breedte mm.:	203
Dikte mm.:	23
Gewicht gr.:	1086

 

Inhoud:

Based on the Zachman Framework for information architecture, this work provides a description of the model and is organized so that different readers can benefit from different parts. It offers a view of the world being addressed by the techniques, methods and tools of the information processing industry.