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Hoofdkenmerken

Auteur:	Hawkes, Peter W.
Redactie:	Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Redacteur:	Hawkes, Peter W.
Titel:	Advances in Imaging and Electron Physics
Uitgever:	Elsevier Science Publishing Co
ISBN:	9780123747624
Serie:	Advances in Imaging and Electron Physics
Land van oorsprong:	United States
Prijs:	€ 226,10
Verschijningsdatum:	04-03-2009
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Postgraduate, Research & Scholarly
Categorie:	Imaging systems & technology
Dewey code:	621.367

Technische kenmerken

Verschijningsvorm:	Hardback
Paginas:	376
Hoogte mm.:	229
Breedte mm.:	151
Dikte mm.:	23
Gewicht gr.:	720

 

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Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.