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Hoofdkenmerken

Auteur:	Zhong-Lin Wang
Titel:	Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Uitgever:	Springer Science+Business
ISBN:	9780306449291
Editie:	1995 ed.
Land van oorsprong:	United States
Prijs:	€ 297.99
Verschijningsdatum:	31-03-1995
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Categorie:	Biology, life sciences
Geillustreerd:	XXVIII, 448 p.
Dewey code:	570

Technische kenmerken

Verschijningsvorm:	Hardback
Paginas:	448
Hoogte mm.:	229
Breedte mm.:	152

 

Inhoud:

For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros­ copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.