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\u003ci\u003eCoulomb Interactions in Particle Beams, Volume 223\u003c/i\u003e in the \u003ci\u003eAdvances in Imaging and Electron Physics\u003c/i\u003e series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.\u003cul\u003e \u003cli\u003eProvides the authority and expertise of leading contributors from an international board of authors\u003c/li\u003e \u003cli\u003ePresents the latest release in the \u003ci\u003eAdvances in Imaging and Electron Physics\u003c/i\u003e series\u003c/li\u003e \u003cli\u003eUpdated release includes the latest information on Coulomb Interactions in Particle Beams\u003c/li\u003e\u003c/ul\u003e |
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