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Modern Characterization of Electromagnetic Systems and its Associated Metrology
Hoofdkenmerken
Auteur: Tapan K. Sarkar; Magdalena Salazar-Palma; Ming Da Zhu; Heng Chen
Titel: Modern Characterization of Electromagnetic Systems and its Associated Metrology
Uitgever: Wiley Professional Development (P&T)
ISBN: 9781119076537
ISBN boekversie: 9781119076469
Editie: 1
Prijs: € 158,26
Verschijningsdatum: 06-08-2021
Inhoudelijke kenmerken
Categorie: Electromagnetism
Taal: English
Imprint: Wiley-IEEE Press
Technische kenmerken
Verschijningsvorm: E-book
 

Inhoudsopgave:

New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques.  The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterization Describes a solution to the generation of non-minimum phase from amplitude-only data Covers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.
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