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Hoofdkenmerken
Auteur: Siddharth Misra; Yifu Han; Yuteng Jin; Pratiksha Tathed
Titel: Multifrequency Electromagnetic Data Interpretation for Subsurface Characterization
Uitgever: Elsevier S & T
ISBN: 9780128214558
ISBN boekversie: 9780128214398
Prijs: € 157,07
Verschijningsdatum: 13-07-2021
Inhoudelijke kenmerken
Categorie: Geophysics
Taal: English
Imprint: Elsevier (S\u0026T)
Technische kenmerken
Verschijningsvorm: E-book
 

Inhoudsopgave:

\u003ci\u003eMultifrequency Electromagnetic Data Interpretation for Subsurface Characterization\u003c/i\u003e focuses on the development and application of electromagnetic measurement methodologies and their interpretation techniques for subsurface characterization. The book guides readers on how to characterize and understand materials using electromagnetic measurements, including dielectric permittivity, resistivity and conductivity measurements. This reference will be useful for subsurface engineers, petrophysicists, subsurface data analysts, geophysicists, hydrogeologists, and geoscientists who want to know how to develop tools and techniques of electromagnetic measurements and interpretation for subsurface characterization.\u003cul\u003e \u003cli\u003eIncludes case studies to add additional color to the presented content \u003c/li\u003e \u003cli\u003eProvides codes for the mechanistic modeling of multi-frequency conductivity and relative permittivity of porous geomaterials\u003c/li\u003e \u003cli\u003ePresents detailed descriptions of multifrequency electromagnetic data interpretation models and inversion algorithm\u003c/li\u003e\u003c/ul\u003e
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