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Hoofdkenmerken

Auteur:	Simon, David S.; Jaeger
Titel:	Quantum Metrology, Imaging, and Communication
Uitgever:	Springer International
ISBN:	9783319835402
Serie:	Quantum Science and Technology
Editie:	Softcover reprint of the original 1st ed. 2017
Land van oorsprong:	Switzerland
Prijs:	€ 193.69
Verschijningsdatum:	04-07-2018
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Categorie:	Materials science
Geillustreerd:	68 Illustrations, color; 37 Illustrations, black and white

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	273
Hoogte mm.:	235
Breedte mm.:	155

 

Inhoud:

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.